Training Process of Cu-Zn-Al Single Crystals Studied by Synchrotron X-Ray Topography

¹ CNRS-CRM C2, Campus Cuminy-Case 913, 13288 Marseille cedex 9, France
² INSA-Lyon, Bât. 502, GEMPPM, 69621 Villeurbanne cedex, France

Abstract

The structure evolutions of Cu-Zn-Al single crystals submitted to thermal cycling, with or without external stress applied during the transformation, have been followed in situ and in real time by synchrotron X-ray topography.

This original method, based on x-ray diffraction, brings information on crystallographic relations between the two phases, on defect distribution and on stresses resulting from the transformation. The comparison of results has permitted to underline the differences in crystal structure evolutions (with or without stress applied) and to approach the origin of the shape memory effect.