| Numéro |
J. Phys. IV
Volume 05, Numéro C3, Avril 1995
37ème Colloque de Métallurgie de l'INSTNMicrostructures et Recristallisation |
|
|---|---|---|
| Page(s) | C3-237 - C3-246 | |
| DOI | https://doi.org/10.1051/jp4:1995321 | |
37ème Colloque de Métallurgie de l'INSTN
Microstructures et Recristallisation
J. Phys. IV 05 (1995) C3-237-C3-246
DOI: 10.1051/jp4:1995321
Laboratoire de Microscopie Ionique, Groupe de Métallurgie Physique, URA 808 du CNRS, Faculté des Sciences, place Emile Blondel, 76821 Mont Saint Aignan cedex, France
© EDP Sciences 1995
Microstructures et Recristallisation
J. Phys. IV 05 (1995) C3-237-C3-246
DOI: 10.1051/jp4:1995321
Evolutions Microstructurales : Observation Directe à l'Echelle Atomique grâce à la Sonde Atomique Tomographique
F. Danoix, B. Deconihout, A. Bostel and D. BlavetteLaboratoire de Microscopie Ionique, Groupe de Métallurgie Physique, URA 808 du CNRS, Faculté des Sciences, place Emile Blondel, 76821 Mont Saint Aignan cedex, France
Abstract
Last year, we presented a contribution to illustrate the increasing role of Atom Probe techniques in the study of solid state phase transformations in metallic materials [1]. We concluded this paper with a mention to the emergence of a new generation of atom probes, giving access to quantitative 3D images on the sub-nanometric scale. In this paper, we will present the instrument of this new generation developed at the Université de Rouen, as well as some of the most interesting results we could obtain since it started to operate last year.
© EDP Sciences 1995