New possibilities of diffraction topography at third generation synchrotron radiation facilities

Abstract
Diffraction topography is an imaging technique for single crystals which allows, through the mapping of the local Bragg reflecting power, the visualization of defects, domains, phases,..., present within the crystal volume. We describe some of the new possibilities of this technique associated with the third generation synchrotron radiation machines : real time observations in the 10^-2 second range, investigation of heavy or bulky materials, and high resolution experiments. These new possibilities are illustrated by the first diffraction topographic observations performed at the ESRF, which were carried out, in white beam, either on the wiggler of the ID11 "Materials Science" beamline or on the D5 Optics "Open Bending Magnet' beamline. The main features of these topographs are the short exposure times (≈10^-2s), the high energy corresponding to the recorded Bragg spots (≈ 50-100 keV), and the good spatial resolution retained even when setting the film far (≈ 60 cm) from the sample. We finally briefly describe the ESRF ID19 beamline devoted to high resolution diffraction and topography.