Numéro
J. Phys. IV France
Volume 04, Numéro C9, Novembre 1994
Proceedings of the European Symposium on Frontiers in Science and Technology with Synchrotron Radiation
Page(s) C9-151 - C9-154
DOI https://doi.org/10.1051/jp4:1994923
Proceedings of the European Symposium on Frontiers in Science and Technology with Synchrotron Radiation

J. Phys. IV France 04 (1994) C9-151-C9-154

DOI: 10.1051/jp4:1994923

Combined x-ray absorption and x-ray diffraction studies of CuGaS2, CuGaSe2, CuFeS2 and CuFeSe2 under high pressure

T. Tinoco1, J.P. Itié1, 2, A. Polian1, A. San Miguel1, 3, E. Moya1, P. Grima1, J. Gonzalez4 and F. Gonzalez5

1  Physique des Milieux Condensés, Université P. & M. Curie, 4 Place Jussieu, BP. 77, 75252 Paris cedex 05, France
2  LURE, Université Paris Sud, Bât. 209D, 91405 Orsay cedex, France
3  ESRF, BP. 220, 38043 Grenoble cedex, France
4  Centro de Estudios de Semiconductores, Universidad de los Andes, Merida 5101, Venezuela
5  Departimento de Fisica, Universidad Central de Venezuela, Ap. 47586, Caracas 1041A, Venezuela


Abstract
I-III-VI2 compounds CuGaS2, CuGaSe2, CuFeS2 and CuFeSe2 have been studied by x-ray absorption spectroscopy and x-ray diffraction as a function of pressure. The combination of both techniques allowed the complete determination of the structures in their whole stability range. The equation of state of these compounds have been determined, as well as the volume compression at the transitions. The recovered phases after a pressure cycle are identical to the initial phases.



© EDP Sciences 1994