| Numéro |
J. Phys. IV France
Volume 04, Numéro C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
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|---|---|---|
| Page(s) | C7-705 - C7-708 | |
| DOI | https://doi.org/10.1051/jp4:19947165 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-705-C7-708
DOI: 10.1051/jp4:19947165
1 Consiglio Nazionale delle Ricerche (CNR), Istituto di Acustica "O.M. Corbino", Via Cassia 1216, 00189 Roma, Italy
2 Electronics Research Laboratories, Nippon Steel Corporation, 5-10-1 Fuchinobe, Sagamihara, Kanagawa 229, Japan
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-705-C7-708
DOI: 10.1051/jp4:19947165
Ultrafast stress pulse detection by laser beam deflection
O.B. Wright1 and T. Hyoguchi21 Consiglio Nazionale delle Ricerche (CNR), Istituto di Acustica "O.M. Corbino", Via Cassia 1216, 00189 Roma, Italy
2 Electronics Research Laboratories, Nippon Steel Corporation, 5-10-1 Fuchinobe, Sagamihara, Kanagawa 229, Japan
Abstract
We describe a direct method for the detection of optically excited ultrashort stress pulses in thin films using a time-resolved pump and probe scheme. Changes in the surface profile are monitored by the angular deflection of a probe beam. Application to the detection of interfacial layers is also demonstrated.
© EDP Sciences 1994