Numéro
J. Phys. IV France
Volume 04, Numéro C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
Page(s) C7-623 - C7-626
DOI https://doi.org/10.1051/jp4:19947147
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique

J. Phys. IV France 04 (1994) C7-623-C7-626

DOI: 10.1051/jp4:19947147

Potentiality of the photothermal surface displacement technique for precisely performed absorption measurement of optical coatings

P. Zimmermann1, D. Ristau2, E. Welsch3, G. Langer4 and M. Reichling4

1  LAYERTEC, Optische Beschichtungen GmbH, Blankenhainer Str. 169, 99441 Mellingen, Germany
2  Universität Hannover, Institut für Quantenoptik, Welfengarten 1, 30167 Hannover, Germany
3  F. Schiller Universität Jena, Institut für Optik und Quantenelektronik, Max-Wien-Platz 1, 07443 Jena, Germany
4  Freie Universität Berlin, Fachbereich Physik, Arnimallee 14, 14195 Berlin, Germany


Abstract
The absolute and comparative determination of the absorption of optical films by the Photothermal-Surface-Displacement-Technique (PTD) is only possible if the sample configuration is in agreement with the limits of the theoretical model. Carrying out simultaneous absorption measurements in the IR-region at λ=10,6 µm by using laser calorimetry as well as the surface displacement technique, it can be demonstrated that the thermophysical properties of the film contribute to the probed surface displacement. The results of PTD measurements at a wavelength of 488 nm show, that there is a similar influence of the film properties on the PTD signal.



© EDP Sciences 1994