| Numéro |
J. Phys. IV France
Volume 04, Numéro C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
|
|---|---|---|
| Page(s) | C7-571 - C7-574 | |
| DOI | https://doi.org/10.1051/jp4:19947134 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-571-C7-574
DOI: 10.1051/jp4:19947134
1 ONERA, L3C, BP. 79, 92322 Châtillon, France
2 CEA, BP. 12, 91680 Bruyères-le-Châtel, France
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-571-C7-574
DOI: 10.1051/jp4:19947134
Micronic thermal characterization of vertical interfaces using the photoreflectance method
F. Lepoutre1, Ph. Forge1, J.L. Joulaud1, L. Paradis2 and D. Rochais21 ONERA, L3C, BP. 79, 92322 Châtillon, France
2 CEA, BP. 12, 91680 Bruyères-le-Châtel, France
Abstract
This paper presents the theoretical and experimental possibilities of a modulated photothermal method, laser induced photoreflectance, for inspecting the quality of interfaces with micronic spatial resolutions. An analytical model is established for semi-infinite materials containing an internal interface perpendicular to the sample surface. The presented application is the detection of thermal resistances in damaged materials.
© EDP Sciences 1994