Numéro
J. Phys. IV France
Volume 04, Numéro C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
Page(s) C7-567 - C7-570
DOI https://doi.org/10.1051/jp4:19947133
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique

J. Phys. IV France 04 (1994) C7-567-C7-570

DOI: 10.1051/jp4:19947133

Applications of phase sensitive thermography for nondestructive evaluation

D. Wu1, W. Karpen1, K. Haupt2, H.-G. Walther2 and G. Busse1

1  Institut für Kunststoffprüfung und Kunststoffkunde, Universität Stuttgart, Pfaffenwaldring 32, 70511 Stuttgart (Vaihingen), Germany
2  Institut für Optik und Quantenelektronik, Physikalisch-Astronomische Fakultät, Friedrich-Schiller Universität, Max-Wien-Platz I, 07743 Jena, Germany


Abstract
The technique of thermal wave thermography combines advantages of both conventional thermal wave measurement and thermography using a commercial IR camera. This technique allows for shorter imaging time and depth profiling. Non-uniformity of heating area and optical surface structures can be suppressed in phase images. Several examples show the potential applications of thermal wave thermography in the field of non-destructive testing.



© EDP Sciences 1994