J. Phys. IV France
Volume 04, Numéro C2, Février 1994European Workshop on Piezoelectric Materials : Crystal Growth, Properties and Prospects
|Page(s)||C2-113 - C2-121|
J. Phys. IV France 04 (1994) C2-113-C2-121
The [SiO4/M]° centers (M = Li or Na) and some physical properties related to these centers in quartzA. HALPERIN
Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem 91904, Israel
The observation and explanation of the thermoluminescence (TL) and x-ray induced luminescence (XL) related to [SiO4/M]±- electron traps in quartz is reviewed. The TL related to these traps appears at about 190 and 200 K (at heating rate of 10 /min) in Li and Na containing quartz respectively. These TL peaks need generally a double irradiation procedure for their excitation. The review describes and discusses some characteristics of these peaks ; e.g. their formation curves, their dependence and preirradiation at various temperatures and their dose dependence. Both the process of formation of the above TL peaks and that of the [SiO4/M]+ related XL involve the migration of the M+ ions in the quartz lattice and as such their investigation should be of help in the understanding of the dielectric losses and of the radiation induced frequency offsets of quartz resonators known to be affected by the migration of Li and Na ions in the quartz lattice.
© EDP Sciences 1994