J. Phys. IV France
Volume 03, Numéro C8, Décembre 1993IX International Conference on Small Angle Scattering
|Page(s)||C8-33 - C8-36|
J. Phys. IV France 03 (1993) C8-33-C8-36
Scanning X-ray scattering of mouldings from semicrystalline polymersP. ZIPPER, A. JÁNOSI and E. WRENTSCHUR
Institute of Physical Chemistry, University of Graz, Heinrichstrasse 28, 8010 Graz, Austria
The layered structure of plastic parts injection-moulded from industrial polypropylenes under varying processing conditions was studied by scanning small-angle and wide-angle X-ray scattering measurements on cross-sections of the parts. The analysis of the data in terms of apparent crystallite sizes, several parameters characterizing the distribution and orientation of different types of crystallites, and long periods is demonstrated by means of selected representative examples.
© EDP Sciences 1993