Numéro |
J. Phys. IV France
Volume 03, Numéro C2, Juillet 1993
International Workshop on Electronic CrystalsECRYS - 93 |
|
---|---|---|
Page(s) | C2-109 - C2-114 | |
DOI | https://doi.org/10.1051/jp4:1993221 |
International Workshop on Electronic Crystals
ECRYS - 93
J. Phys. IV France 03 (1993) C2-109-C2-114
DOI: 10.1051/jp4:1993221
Laboratoire de Physique des Solides, URA CNRS 02, bât. 510, Université Paris-Sud, 91405 Orsay, France
© EDP Sciences 1993
ECRYS - 93
J. Phys. IV France 03 (1993) C2-109-C2-114
DOI: 10.1051/jp4:1993221
Structural studies of the CDW interaction with defects
S. RAVY and J.P. POUGETLaboratoire de Physique des Solides, URA CNRS 02, bât. 510, Université Paris-Sud, 91405 Orsay, France
Abstract
We present new X-ray diffise scattering effects due to pinning of the phase of charge
density waves (CDW's) on defects. The coherence between the position of a defect and the
phase of a 2 k p~eri odic lattice distortion gives rise to an asymmetry of the +2k~/-2kd iffise
intensity with respect to the layers of main Bragg reflections. This effect, negligible in the weak
pinning limit, becomes dominant for strong pinning. In addition, CDW phase distortions
around defects produce an asyrnmetry of each individual 2+ diffuse lines. We first calculate
the scattered intensity in these different cases that we illustrate by experimental results taken
from charge transfer organic salts of the TTF-TCNQ family.
© EDP Sciences 1993