Numéro |
J. Phys. IV France
Volume 01, Numéro C7, Décembre 1991
2nd International ConferenceLaser M2P |
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Page(s) | C7-745 - C7-748 | |
DOI | https://doi.org/10.1051/jp4:19917200 |
2nd International Conference
Laser M2P
J. Phys. IV France 01 (1991) C7-745-C7-748
DOI: 10.1051/jp4:19917200
Centre National d'Etudes des Télécommunications, LAB/OCM/TOH, route de Trégastel, F-22301 Lannion, France
© EDP Sciences 1991
Laser M2P
J. Phys. IV France 01 (1991) C7-745-C7-748
DOI: 10.1051/jp4:19917200
AMPLITUDE OR INTENSITY STABILITY IN SEMICONDUCTOR LASERS
I. JOINDOTCentre National d'Etudes des Télécommunications, LAB/OCM/TOH, route de Trégastel, F-22301 Lannion, France
Abstract
For the physicians, noise measurements on semiconductor laser diodes (SC-LD) provide accurate informations on stability and fundamental parameters which stand into rate equations describing the interaction between photons and electrons. But intensity fluctuations worry users of SC-LD coupled to optical fibres, in amplitude modulation analog transmission techniques. In this paper, we first consider how the noise is caracterized. Then we describe the measurement techniques and give results on different types of SC-LD.
© EDP Sciences 1991