Thermal stability of Gd2O3/Si(100) interfacial transition layer H. Nohira, T. Yoshida, H. Okamoto, S. Shinagawa, W. Sakai, K. Nakajima, M. Suzuki, K. Kimura, Ng Jin Aun, Y. Kobayashi et al. (6 more) J. Phys. IV France, 132 (2006) 273-277 Published online: 11 March 2006 DOI: 10.1051/jp4:2006132052