Journal de Physique IV

Thermoreflectance measurements on test microelectronic devices at several probe wavelengths: Comparison between CCD and focused laser techniques

L.R. de Freitas, A.M. Mansanares, E.C. da Silva, M.C.B. Pimentel, S. Finco, G. Tessier and D. Fournier

J. Phys. IV France, 125 (2005) 121-124

DOI: 10.1051/jp4:2005125028

L.R. de Freitas

A.M. Mansanares

E.C. da Silva

M.C.B. Pimentel

S. Finco

G. Tessier

D. Fournier

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