High breakdown n+-GaAs/δ-doped(p+)-GaInP/n-GaAs heterojunction camel-gate FET grown by LP-MOCVD W.C. Liu, W.L. Chang, H.J. Pan, J.Y. Chen, W.C. Wang, K.H. Yu and S.C. Feng J. Phys. IV France, 09 PR8 (1999) Pr8-1171-Pr8-1177 DOI: 10.1051/jp4:19998146