Journal de Physique IV

XAFS Studies of TiSi₂ and CoSi₂ Thin Films at the Ti, Co and Si K-Edge

I. Coulthard, T.K. Sham, M. Simard-Normandin, M. Saran and J.D. Garrett

J. Phys. IV France, 7 C2 (1997) C2-1135-C2-1136

DOI: 10.1051/jp4:19972160

I. Coulthard

T.K. Sham

M. Simard-Normandin

M. Saran

J.D. Garrett

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