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Stress-assisted two-way memory effect electrically driven in 50at.%Ti–45at.%Ni–5at.%Cu alloy

F. Gariboldi, S. Besseghini and G. Airoldi
Materials Science and Engineering: A 438-440 653 (2006)
DOI: 10.1016/j.msea.2006.02.096
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