Articles citing this article

The Citing articles tool gives a list of articles citing the current article.
The citing articles come from EDP Sciences database, as well as other publishers participating in CrossRef Cited-by Linking Program. You can set up your personal account to receive an email alert each time this article is cited by a new article (see the menu on the right-hand side of the abstract page).

Cited article:

High resolution thermoreflectance imaging on transistor arrays with defect-induced leakage

G. Tessier, C. Filloy, M.L. Polignano, I. Mica, G. Jerosolimski, S. Holé, D. Fournier

J. Phys. IV France, 125 (2005) 423-425

DOI: https://doi.org/10.1051/jp4:2005125099

PDF (1.232 MB)

This article has been cited by the following article(s):

Concurrent characterization of GaN MOSHEMT gate leakage via electrical and thermoreflectance measurements

David Kortge, Kerry Maize, Xiao Lyu, Peter Bermel, Peide Ye and Ali Shakouri
Microelectronics Reliability 148 115122 (2023)
https://doi.org/10.1016/j.microrel.2023.115122

Surface wetting to enhance thermoreflectance characterization of integrated circuits

S. Alajlouni and A. Shakouri
Review of Scientific Instruments 93 (10) (2022)
https://doi.org/10.1063/5.0101963

Thermal Nanosystems and Nanomaterials

Gilles Tessier
Topics in Applied Physics, Thermal Nanosystems and Nanomaterials 118 389 (2009)
https://doi.org/10.1007/978-3-642-04258-4_13

CCD-based thermoreflectance microscopy: principles and applications

M Farzaneh, K Maize, D Lüerßen, et al.
Journal of Physics D: Applied Physics 42 (14) 143001 (2009)
https://doi.org/10.1088/0022-3727/42/14/143001

Thermography techniques for integrated circuits and semiconductor devices

Wenjun Liu, GUEST SPECIALIST: and Bozhi Yang
Sensor Review 27 (4) 298 (2007)
https://doi.org/10.1108/02602280710821434

Quantitative Thermoreflectance Imaging: Calibration Method and Validation on a Dedicated Integrated Circuit

Gilles Tessier, Sabrina Pavageau, Benoit Charlot, et al.
IEEE Transactions on Components and Packaging Technologies 30 (4) 604 (2007)
https://doi.org/10.1109/TCAPT.2007.898384

Thermoreflectance temperature imaging of integrated circuits: calibration technique and quantitative comparison with integrated sensors and simulations

G Tessier, M-L Polignano, S Pavageau, et al.
Journal of Physics D: Applied Physics 39 (19) 4159 (2006)
https://doi.org/10.1088/0022-3727/39/19/007