Étude de la variation du paramètre de réseau de solutions solides Cu-Ni par diffraction des rayons X
J. Phys. IV France, 118 (2004) 409-411
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X-ray diffraction analysis of cold-worked Cu-Ni-Si and Cu-Ni-Si-Cr alloys by Rietveld method
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https://doi.org/10.1016/S1003-6326(11)60740-1