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Cited article:

Vanadium pentoxide thin films deposited by atomic layer deposition: A model electrode for investigating the structural changes induced by lithium intercalation

R. Baddour-Hadjean, V. Golabkan, J.P. Pereira-Ramos, A. Mantoux, D. Lincot

J. Phys. IV France, 11 PR11 (2001) Pr11-85-Pr11-90

DOI: https://doi.org/10.1051/jp4:20011113

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Two-dimensional recrystallisation processes of nanometric vanadium oxide thin films grown by atomic layer chemical vapor deposition (ALCVD) evidenced by AFM

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Thin films of VO2 on glass by atomic layer deposition: microstructure and electrical properties

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