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Cited article:

Diffraction des rayons X sur couches minces polycristallines ou épitaxiées. Utilisation d'un montage en réflexion asymétrique équipé d'un détecteur courbe à localisation

C. Mary, P. Lenormand, R. Guinebretière, A. Lecomte, A. Dauger

J. Phys. IV France, 10 PR10 (2000) Pr10-377-Pr10-386

DOI: https://doi.org/10.1051/jp4:20001040

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This article has been cited by the following article(s):

X-ray Diffraction by Polycrystalline Materials

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Physical Review B 65 (14) 144302 (2002)
https://doi.org/10.1103/PhysRevB.65.144302

Microstructural analysis in epitaxial zirconia layers

A. Boulle, L. Pradier, O. Masson, R. Guinebretière and A. Dauger
Applied Surface Science 188 (1-2) 80 (2002)
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Miscut angles measurement and precise sample positioning with a four circle diffractometer

A. Boulle, O. Masson, R. Guinebretière and A. Dauger
Applied Surface Science 180 (3-4) 322 (2001)
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