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Cited article:

Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±δ thin films prepared by a dip-coating process

P. Lenormand, A. Lecomte, C. Laberty-Robert, F. Ansart and A. Boulle
Journal of Materials Science 42 (12) 4581 (2007)
https://doi.org/10.1007/s10853-006-0560-3

Sol–gel processing of TeO2 thin films from citric acid stabilised tellurium isopropoxide precursor

A. Lecomte, F. Bamière, S. Coste, P. Thomas and J.C. Champarnaud-Mesjard
Journal of the European Ceramic Society 27 (2-3) 1151 (2007)
https://doi.org/10.1016/j.jeurceramsoc.2006.05.029

Growth and relaxation of (Zr,Y)O2 epitaxial layers analyzed by XRD reciprocal space mapping

R Guinebretière, R Bachelet, A Boulle, et al.
Materials Science and Engineering: B 109 (1-3) 42 (2004)
https://doi.org/10.1016/j.mseb.2003.10.082