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Cited article:

Residual Stress Evaluation at Bone Implant Interfaces Using High Energy X-Ray Diffraction

Bastien Mireux, Thomas Buslaps, Veijo Honkimäki, Alain Lodini and Jean Michel Sprauel
Materials Science Forum 652 180 (2010)
https://doi.org/10.4028/www.scientific.net/MSF.652.180