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Cited article:

Thickness dependence on the dielectric properties of BaTiO3/SrTiO3-multilayers

G. Koebernik, W. Haessler, R. Pantou and F. Weiss
Thin Solid Films 449 (1-2) 80 (2004)
https://doi.org/10.1016/j.tsf.2003.10.031

Chemical Physics of Thin Film Deposition Processes for Micro- and Nano-Technologies

G. Wahl, J. Arndt and O. Stadel
Chemical Physics of Thin Film Deposition Processes for Micro- and Nano-Technologies 145 (2002)
https://doi.org/10.1007/978-94-010-0353-7_7

Structural and dielectric properties of BaTiO3SrTiO3-multilayers deposited by PLD

G. Koebernik, W. Haessler, H. D. Bauer, et al.
Integrated Ferroelectrics 33 (1-4) 373 (2001)
https://doi.org/10.1080/10584580108222319