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Cited article:

Experimental Analysis and Modeling of Self-Heating and Thermal Coupling in 28 nm FD-SOI CMOS Transistors Down to Cryogenic Temperatures

Flávio Enrico Bergamaschi, Tadeu Mota Frutuoso, Bruna Cardoso Paz, Gérard Billiot, Aloysius G. M. Jansen, Phillipe Galy, Emmanuel Vincent, Fred Gaillard, Blandine Duriez and Mikaël Cassé
IEEE Transactions on Electron Devices 71 (4) 2598 (2024)
https://doi.org/10.1109/TED.2024.3367316