Issue |
J. Phys. IV France
Volume 137, November 2006
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Page(s) | 103 - 106 | |
DOI | https://doi.org/10.1051/jp4:2006137020 | |
Published online | 23 December 2006 |
J. Bodzenta, M. Dzida and T. Pustelny
J. Phys. IV France 137 (2006) 103-106
DOI: 10.1051/jp4:2006137020
Shaping of coherence function of sources used in low-coherent measurement techniques
M. Jedrzejewska-Szczerska, B.B. Kosmowski and R. HypszerDepartment of Optoelectronics, Gdansk University of Technology, Narutowicza 11/12, Gdansk 80-952, Poland
(Published online 23 December 2006)
Abstract
In low-coherent measurement techniques, such as: low-coherent
interferometry, low-coherent reflectometry and low-coherent optical
tomography, the coherence length of the source is one of the
critical parameters of the designed system. The coherence length of
the source effects the resolution of the measurement system.
Commercially available low-coherent sources, as the most popular one
- SLDs, have the coherence length at the range of 20-40 m. In
many applications it is too little to get the required resolution of
the measurement. Hence, it is necessary to use some techniques to
change the coherence length of the source. It is possible to do so
by shaping the spectral characteristic of the source. One of the
most effective methods is to use a combination of a few properly
chosen sources called synthesizing multiwavelength combination of
sources.
© EDP Sciences 2006