Issue |
J. Phys. IV France
Volume 134, August 2006
EURODYMAT 2006 - 8th International Conference on Mechanical and Physical Behaviour of Materials under Dynamic Loading
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Page(s) | 667 - 672 | |
DOI | https://doi.org/10.1051/jp4:2006134103 | |
Published online | 26 July 2006 |
J. Cirne, R. Dormeval, et al.
J. Phys. IV France 134 (2006) 667-672
DOI: 10.1051/jp4:2006134103
Calculating the effect of configuration on the response of manganin stress gauges
R.E. Winter and E.J. HarrisHydrodynamics Department, AWE, Aldermaston, Reading, Berkshire RG7 4PR, UK
Published online: 26 July 2006
Abstract
In the “Orthogonal Gauge” technique stress gauges mounted to
measure both longitudinal and transverse (or lateral) stresses in a shocked
matrix allow the shear strength of the matrix material to be determined. A
useful measure of the sensitivity of an orthogonal gauge system to changes
in the yield strength of the matrix material is provided by the ratio
between the resistance change of gauges of a given cross-sectional shape
mounted in transverse and longitudinal orientations, (the T/L Ratio). A low
T/L Ratio indicates a more sensitive system. A Eulerian Hydrocode,
(Shamrock), has been used to compute the resistance change of manganin wires
of rectangular cross section and infinite length embedded in both
longitudinal and transverse orientation in steel targets subjected to
nominally one-dimensional shocks. Configurations in which the gauges were
(a) embedded directly into the steel and (b) mounted within thin
strengthless polymer layers were studied. It is shown that in case (a) the
T/L Ratio decreases as the aspect ratio of the gauge cross-section
increases. When the gauges are embedded in a strengthless polymer layer the
T/L Ratio is lower than when the gauges are embedded directly into the
matrix but in this case the aspect ratio of the manganin conductor has
little influence on the T/L Ratio. The observed resistance changes are
explained in terms of the stresses in the gauges. The results give insight
into the factors which control resistance change and offer the prospect of
improvements to current gauge designs.
© EDP Sciences 2006