| Issue |
J. Phys. IV France
Volume 133, June 2006
|
|
|---|---|---|
| Page(s) | 951 - 953 | |
| DOI | https://doi.org/10.1051/jp4:2006133191 | |
| Published online | 16 June 2006 | |
J.-C. Gauthier, et al.
J. Phys. IV France 133 (2006) 951-953
DOI: 10.1051/jp4:2006133191
Recovery of CVD diamond detectors using laser double pulses
L.S. Dauffy1, R.A. Lerche1, G.J. Schmid1, J.A. Koch1 and C. Silbernagel21 Lawrence Livermore National Laboratory, Livermore, CA 94550, USA
2 Bechtel Nevada Calibration Facilities, Livermore, CA 94551, USA
Abstract
A
mm Chemical Vapor Deposited (CVD) diamond
detector, with a voltage bias of +250 V, was excited by a
400 nm laser (3.1 eV photons) in order to study the saturation of
the wafer and its associated electronics. In a first experiment, the
laser beam energy was increased from a few tens of a pJ to about
100 
J, and the signal from the diamond was recorded until
full saturation of the detection system was achieved. Clear
saturation of the detection system was observed at about 40 V,
which corresponds with the expected saturation at 10% of the
applied bias (250 V). The results indicate that the interaction
mechanism of the 3.1 eV photons in the diamond (E
eV) is not a multi-photon process but is linked to the
impurities and defects of the crystal. In a second experiment, the
detector was irradiated by a saturating first laser pulse and then
by a delayed laser pulse of equal or smaller amplitude with delays
of 5, 10, and 20 ns. The results suggest that the diamond and
associated electronics recover within 10 to 20 ns after a strong
saturating pulse.
© EDP Sciences 2006