Issue |
J. Phys. IV France
Volume 126, June 2005
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Page(s) | 139 - 142 | |
DOI | https://doi.org/10.1051/jp4:2005126028 |
J. Phys. IV France 126 (2005) 139-142
DOI: 10.1051/jp4:2005126028
Piezoelectric and elastic properties of new layered
ferroelectric-semiconductor materials of Sn
P
S
family
V. Samulionis1, J. Banys1 and Yu. Vysochanskii2 1 Physics Department of Vilnius University, Sauletekio 9/3, 10222 Vilnius, Lithuania
2 Institute of Solid State Physics and Chemistry of Uzhgorod University, Ukraine
Abstract
In this contribution, we present review of elastic and
piezoelectric properties of new polar layered materials of
Sn2P2S6 family such as: CuInP2S6,
CuInP2Se6, CuCrP2S6 and SnP2S6. These,
recently obtained compounds, exhibit rich variety of piezoelectric
properties, photosensitivity and ionic conductivity. Two investigation
methods: resonance-antiresonance and ultrasonic pulse echo were used in
order to measure the elastic and piezoelectric constants. The temperature
dependences of longitudinal ultrasonic velocity and attenuation revealed
clear anomalies near phase transitions in these layered materials. We
observed large elastic nonlinearity in CuInP2S6 samples across
layers in c-direction. The elastic nonlinnearity along layerss was much
smaller. By direct pulse-echo experiments in low temperature phases, it was
shown that the thin plates of CuInP2S6, CuCrP2S6,
CuInP2Se6 and SnP2S6 layered compounds could effectively
excite and detect ultrasonic waves.
© EDP Sciences 2005