J. Phys. IV France
Volume 125, June 2005
Page(s) 113 - 116

J. Phys. IV France 125 (2005) 113-116

DOI: 10.1051/jp4:2005125026

Scanning thermal microscopy based on a modified atomic force microscope combined with pyroelectric detection

J.-S. Antoniow1, M. Chirtoc1, N. Trannoy1, O. Raphael1 and J. Pelzl2

1  UTAP, UFR Sciences, Moulin de la Housse, BP. 1039, 51687 Reims, France
2  Inst. Exp. Phys., Solid State Spectroscopy, Ruhr-University, 44780 Bochum, Germany

We propose a novel approach in scanning thermal microscopy of layered samples. The thermal probe (ThP) (Wollaston wire) acts as a local a.c. heat source at the front of a sample layer deposited on a pyroelectric (PE) sensor. The PE signal is proportional to the heat wave transmitted through the sample. The ThP and PE signals can be used to generate complementary thermal conductivity maps and with some restrictions, thermal diffusivity maps of the sample. Additionally, the topography map is obtained in the usual way from the atomic force microscope. We give the theoretical background for the interpretation of PE signal obtained at low and at high frequency, and we demonstrate that it carries information on the thermal diffusivity of a test sample (12 $\mu$m thick PET polymer sheet). Finally, we discuss the contributions of heat transfer channels between ThP and sample, and the role of contact thermal resistance.

© EDP Sciences 2005