| Issue |
J. Phys. IV France
Volume 117, October 2004
|
|
|---|---|---|
| Page(s) | 65 - 72 | |
| DOI | https://doi.org/10.1051/jp4:2004117010 | |
J. Phys. IV France 117 (2004) 65-72
DOI: 10.1051/jp4:2004117010
FT-IR/PAS in analysis of CD discs
J. Ryczkowski, S. Pasieczna and B. PeregrynUniversity of Maria Curie-Sklodowska, 20-031 Lublin, Poland
Abstract
Compact disc (CD) represents new optical recording technology, and has the advantage of being able to record an enormous amount
of data. Depending on the kind of CD (e.g., recordable - CD-R, rewritable - CD-RW) it is characterized by a different structure.
Photoacoustic (PA) spectroscopy in an infrared region (FT-IR/PAS) was applied for the inspection of the surface of different
CDs. Analyzed CD's samples were taken from polycarbonate substrate, recorded and non-recorded areas. Observed surface changes
are due to recording process.
© EDP Sciences 2004