| Issue |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 643 - 645 | |
| DOI | https://doi.org/10.1051/jp4:20030162 | |
J. Phys. IV France 104 (2003) 643
DOI: 10.1051/jp4:20030162
Wavelet-based image restoration of compact X-ray microscope images
H. Stollberg1, J. Boutet de Monvel2, G.A. Johansson1 and H.M. Hertz11 Biomedical & X-Ray Physics, Royal Institute of Technology/SCFAB, 10691 Stockholm, Sweden
2 Institute of Hearing and Communication Research, Karolinska Institute, 17176 Stockholm, Sweden
Abstract
Compact X-ray microscopy employing optics, such as mulitlayer mirrors and zone plates, with limited
collection angles and efficiencies will a) ways be limited on photons for short exposure times. Thus, it is important to investigate
methods for improving the signal-to-noisé ratio in the images. We show on data taken with the Stockholm laser-plasma-based
X-ray microscope at 3.3 nm that a wavelet-based denoising procédure has potential to reduce the exposure time a factor 2 without
loss of image information.
© EDP Sciences 2003