Issue
J. Phys. IV France
Volume 11, Number PR11, Décembre 2001
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures
Page(s) Pr11-227 - Pr11-231
DOI https://doi.org/10.1051/jp4:20011137
International Conference on Thin Film Deposition of Oxide Multilayers Hybrid Structures

J. Phys. IV France 11 (2001) Pr11-227-Pr11-231

DOI: 10.1051/jp4:20011137

A Raman scattering investigation of tensile strain in La0.7Sr0.3Mn03/SrTi03 multilayers

J. Kreisel1, G. Lucazeau2, C. Dubourdieu1, M. Rosina1, 3 and F. Weiss1

1  Laboratoire des Matériaux et du Génie Physique, ENS de Physique de Grenoble, France
2  Laboratoire d'Électrochimie, de Physicochimie des Matériaux et Interfaces, ENS d'Électrochimie et d'Électrométallurgie de Grenoble, France
3  Institute of Electrical Engineering, Slovak Academy of Science, Bratislava, Slovakia


Abstract
We report a Raman scattering study of perovskite-type (La0.7Sr0.3MnO3)m/(SrTiO3)n multilayers, m and n being the thickness of individual layers. The observed Raman spectra for different n and m are discussed in the light of structural modifications, namely a tensile-strain-induced rhombohedral-to-orthorhombic phase transition in the La0.7Sr0.3MnO3-layers. The present work validates tensile strain as an important variable in thin films, which does not only allow to distort the perovskite structure within a crystallographic space group but can well induce a transition towards another space group and its related physical properties.



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