Noise of high-Tc superconducting films and bolometers

I.A. Khrebtov; V.N. Leonov; A.D. Tkachenko; P.V. Bratukhin; A.A. Ivanov; A.V. Kuznetsov; H. Neff; E. Steinbeiß; W. Michalke; T. Heidenblut; J.K. Laukemper

doi:doi:10.1051/jp4:1998365

Issue		J. Phys. IV France Volume 08, Number PR3, June 1998 Proceedings of the 3^rd European Workshop on Low Temperature Electronics WOLTE 3


Page(s)		Pr3-293 - Pr3-296
DOI		https://doi.org/10.1051/jp4:1998365

Proceedings of the 3^rd European Workshop on Low Temperature Electronics
WOLTE 3

J. Phys. IV France 08 (1998) Pr3-293-Pr3-296
DOI: 10.1051/jp4:1998365

Noise of high-T_c superconducting films and bolometers

I.A. Khrebtov¹, V.N. Leonov¹, A.D. Tkachenko¹, P.V. Bratukhin², A.A. Ivanov², A.V. Kuznetsov², H. Neff³, E. Steinbeiß⁴, W. Michalke⁴, T. Heidenblut⁵ and J.K. Laukemper⁵

¹ S.I. Vavilov State Optical Institute, 199034 St. Petersburg, Russia
² Moscow Institute of Engineering and Physics, 115409 Moscow, Russia
³ University of Parabio at Campina Grande, Brazil
⁴ Institut für Physikalishe Hochtechnologie, Helmholzweg 4, 07743 Jena, Germany
⁵ Institut für Habeiter Technologie und Werkstoffe der Elektotechnik, 30149 Hannover, Germany

Abstract
The results of the noise investigations of high-T_c superconducting films (HTS) and bolometers are reported. HTS films produced by the magnetron and laser depositions on various substrates were studied. Structural, excess noise and critical current properties were investigated Noise measurements of antenna YBa₂Cu₃O_7-x microbolometer on NdGaO₃ substrate and GdBa₂Cu₃O_7-x bolometer on Si-membrane showed that the noise parameters of bolometers were limited by only the phonon noise at operating frequency.