| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-911 - C2-912 | |
| DOI | https://doi.org/10.1051/jp4:1997277 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-911-C2-912
DOI: 10.1051/jp4:1997277
1 Department of Applied Chemistry, School of Engineering, Nagoya University, Nagoya 464-01, Japan
2 Department of Molecular Engineering, School of Engineering, Kyoto University, Kyoto 606-01, Japan
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-911-C2-912
DOI: 10.1051/jp4:1997277
Mg K-Edge XAFS Study of Silica-Magnesia Systems
H. Yoshida1, T. Yoshida2, T. Tanaka2, T. Funabiki2, S. Yoshida2, T. Abe1, K. Kimura1 and T. Hattori11 Department of Applied Chemistry, School of Engineering, Nagoya University, Nagoya 464-01, Japan
2 Department of Molecular Engineering, School of Engineering, Kyoto University, Kyoto 606-01, Japan
Abstract
Mg K-edge XAFS study was carried out to clarify the local structure of silica-magnesia systems prepared in four ways ; by impregnation of silica with an aqueous solution of magnesium nitrate or with a methanol solution of magnesium methoxide, and by sol-gel method with tetraethyl orthosilicate and magnesium solutions mentioned above. It is clarified that the preparation method decides the structure of Mg species respectively ; (i) MgO particle on silica, (ii) dispersed Mg species on silica surface, (iii) dispersed Mg tetrahedral species in silica bulk.
© EDP Sciences 1997