| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-827 - C2-828 | |
| DOI | https://doi.org/10.1051/jp4:1997250 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-827-C2-828
DOI: 10.1051/jp4:1997250
Departamento de Química Inorgánica, Instituto de Ciencia de Materiales, Universidad de Sevilla, CSIC, P. O. Box 874, 41080 Sevilla, Spain
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-827-C2-828
DOI: 10.1051/jp4:1997250
XAFS Study of the Main Constituent Elements of Layered Aluminosilicates
M.A. Castro, M.D. Alba, R. Alvero, A.I. Becerro, A. Muñoz-Páez and J.M. TrilloDepartamento de Química Inorgánica, Instituto de Ciencia de Materiales, Universidad de Sevilla, CSIC, P. O. Box 874, 41080 Sevilla, Spain
Abstract
Changes in the Si and Al K-edges XANES signals for a series of well characterized phyllosilicates have been examined. Results obtained for the different specimens have been interpreted in accordance with the changes in the structural compositions of the minerals and with the results of previous theoretical and experimental studies of related compounds. In both edges appear typical features that can be associated with dioctahedral and trioctahedral series.
© EDP Sciences 1997