Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-159-C2-160
DOI: 10.1051/jp4/1997150

Experimental and Theoretical Comparison between Absorption, Total Electron Yield and Fluorescence Spectra of the Thulium M5 Edge

M. Pompa¹, A.M. Flank¹, P. Lagarde¹, J. Rife², I. Stekhin³, M. Nakazawa⁴, H. Ogasawara⁵ and A. Kotani<sup>4

1</sup>  LURE, bâtiment 209d, Centre Universitaire, 91405 Orsay, France
²  Naval Research Lab., code 6686, 4555 Overlook Ave. SW, Washington DC 20375, U.S.A.
³  Physical Department, Rostov State University, Rostov-on-Don 344104, Russia
⁴  Institute for Solid State Physics, University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan
⁵  Physical Department, Rostov State University, Rostov-on-Don 344104 Russia

Abstract
Beside the now well known self absorption effect, several phenomena related to the multiplet structure of the intermediate state may occur which will render the X-ray fluorescence different from the true absorption result on 3d transition metals at the L edge and on the M4,5 edges of rare earths. Special selection roles of the radiative de-excitation process may play an important role there. We have measured the absorption, coefficient of a thin film of thulium deposited onto an aluminum foil, at room temperature, through the simultaneous detection of the transmission, 160 eV bandwidth fluorescence yield and total electron yield. While transmission and electron yield results are very similar, as expected for a very thin sample, the fluorescence yield spectrum is definitely different. Theoretically, the resonant X-ray fluorescence spectrum was calculated using an atomic model, and then integrated over the emitted energy, to predict the fluorescence yield spectrum. A very good agreement is obtained between the theory and experiment.

© EDP Sciences 1997