| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-1129 - C2-1130 | |
| DOI | https://doi.org/10.1051/jp4:19972157 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-1129-C2-1130
DOI: 10.1051/jp4:19972157
1 Aristotle University of Thessaloniki, Department of Physics, 54006 Thessaloniki, Greece
2 Hahn-Meitner Institute (A.S.), Glienicker Str. 100, 14109 Berlin, Germany
3 Aristotle University of Thessaloniki, Department of Physics 54006 Thessaloniki, Greece.
4 University of Nottingham, Department of Physics, NG7 2RD, UK
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-1129-C2-1130
DOI: 10.1051/jp4:19972157
Angle Resolved NEXAFS Spectra of Hexagonal and Cubic GaN
M. Katsikini1, 2, E.C. Paloura2, 3, T.S. Cheng4 and C.T. Foxon41 Aristotle University of Thessaloniki, Department of Physics, 54006 Thessaloniki, Greece
2 Hahn-Meitner Institute (A.S.), Glienicker Str. 100, 14109 Berlin, Germany
3 Aristotle University of Thessaloniki, Department of Physics 54006 Thessaloniki, Greece.
4 University of Nottingham, Department of Physics, NG7 2RD, UK
Abstract
Phase stabilised cubic and hexagonal GaN thin films, grown by MBE, are studied using angle (φ) resolved NEXAFS measurements at the N-K-edge. It is demonstrated that the energy positions and intensities of the characteristic NEXAFS resonances depend on the crystal symmetry and can be used as a fingerprint of the symmetry of the examined crystal. Deviations from the cubic or hexagonal symmetries are clearly detectable since they lead to a shift in the resonances of the NEXAFS structure and a characteristic intensity angular dependence. Based on the above results, a formalization for a quantitative assessment of the cubic and hexagonal contributions in a mixed crystal is discussed.
© EDP Sciences 1997