Issue
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-1115 - C2-1117
DOI https://doi.org/10.1051/jp4:19972151
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-1115-C2-1117

DOI: 10.1051/jp4:19972151

XAFS Measurements on Co-K and Pt-LIII Edges in (111) CoPt3 Films

C. Meneghini1, 2, M. Maret3, M.C. Cadeville3 and J.L. Hazemann4

1  INFN, Laboratori Nazionali di Frascati, P. O. Box 13, 00044 Frascati (Roma), Italy
2  Istituto Nazionale per la Fisica della Materia, Via dell'Acciaio 139, 16153 Genova, Italy
3  Institut de Physique et Chimie des Matériaux de Strasbourg, GEMM, UMR 46 CNRS-ULP, 23 rue du Loess, 67037 Strasbourg cedex, France
4  Laboratoire de Cristallographie, CNRS, BP. 166, 38042 Grenoble, France


Abstract
XAFS measurements at the Co-K edge and Pt-LIII edge were performed in an (111) epitaxial CoPt3 film with strong perpendicular magnetic anisotropy. The analysis of XAFS data obtained using in-plane and out-of-plane polarization show the existence of an anisotropic local order characterized by preferential heteroatomic pairs out of the film plane balanced with preferential homoatomic pairs in the (111) plane. The isotropic local order found in a magnetically isotropic CoPt3 film from Pt-LIII edge data should be confirmed by XAFS measurements on Co-edge.



© EDP Sciences 1997