| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
|
|
|---|---|---|
| Page(s) | C2-1101 - C2-1102 | |
| DOI | https://doi.org/10.1051/jp4:19972147 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-1101-C2-1102
DOI: 10.1051/jp4:19972147
Physics Department, Rensselaer Polytechnic Institute, Troy NY 12180-3590, U.S.A.
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-1101-C2-1102
DOI: 10.1051/jp4:19972147
Stability of CdS Nanocrystals in Glass
T.M. Hayes, L.B. Lurio, J. Pant, P.D. Persans and H. YükseliciPhysics Department, Rensselaer Polytechnic Institute, Troy NY 12180-3590, U.S.A.
Abstract
We have measured and analyzed optical absorption and x-ray absorption spectra of CdS nanocrystals grown by solid-state reaction in a borosilicate glass, with average crystallite radii from 1.4 to 5 nm. The first (Cd-S) and second (Cd-Cd) neighbor distances are within 0.2% of the bulk values in all cases. We establish an upper bound for the interfacial tension of 0.15 N/m. Such low interface tension suggests that glass-embedded nanocrystals are inherently more stable than bare or capped nanocrystals of the same size.
© EDP Sciences 1997