X-Ray Dichroism in Absorption and Reflection Spectroscopy in Graphite Crystal

Abstract
A new way for development of x-ray polaroid is suggested. The idea is based on a strong difference between absorption coefficients of normal and abnormal waves in anomalous dispersion region in low-symmetry crystals in the case when the glancing angle of the incident radiation is close to the critical angle of the total external reflection. Polarization coefficient for graphite crystal near carbon K absorption edge is calculated for different glancing angles. It is shown that the method treated gives the simple way to construct an effective x-ray polaroid. Also the polarization dependence of x-ray reflectivity fine structure has been investigated in graphite crystal.