| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-705 - C2-706 | |
| DOI | https://doi.org/10.1051/jp4:1997212 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-705-C2-706
DOI: 10.1051/jp4:1997212
Photon Factory, National Laboratory for High Energy Physics, 1-1 Oho, Tsukuba, Ibaraki 305, Japan
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-705-C2-706
DOI: 10.1051/jp4:1997212
Soft X-Ray Absorption Spectroscopy with Variable Surface Sensitivity using Fluorescence Yield Detection
Y. KitajimaPhoton Factory, National Laboratory for High Energy Physics, 1-1 Oho, Tsukuba, Ibaraki 305, Japan
Abstract
Surface sensitivity in the soft X-ray absorption spectroscopy by the fluorescent X-ray yield detection under grazing exit condition is discussed. It is experimentally demonstrated at Si K-edge that the sampling depth can be controlled by changing exit angles in the vicinity of the critical angle for total reflection.
© EDP Sciences 1997