| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-91 - C2-96 | |
| DOI | https://doi.org/10.1051/jp4/1997022 | |
J. Phys. IV France 7 (1997) C2-91-C2-96
DOI: 10.1051/jp4/1997022
'Self-Absorption' Effects in Grazing-Incidence Total Electron-Yield XAS
S.L.M. Schroeder1, 2, G.D. Moggridge3, R.M. Lambert1 and T. Rayment11 Department of Chemistry, University of Cambridge, Lensfield Road, Cambridge CB2 1EW, U.K.
2 Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4.6, D-14195 Berlin FRG
3 Department of Chemical Engineering, University of Cambridge, Pembroke Street, Cambridge CB2 3RA, UK
Abstract
Uniformly reduced amplitudes of the extended X-ray absorption fine-structure (EXAFS) detected by total
electron-yield (TBY) methods have repeatedly been reported in the literature. Some authors ascribed them to the presence of
a 'disordered' near-surface layer on the sample, but in situ TEY EXAFS investigations of the annealing behaviour of Ni
provide experimental evidence against this hypothesis. It is shown that an amplitude reduction previously observed for
metallic Ni can be corrected by taking account of a 'self-absorption' effect which occurs in TEY measurements at grazing
X-ray incidence. Furthermore, the TEY also contains contributions excited by fluorescent photons which are another source
of distorted EXAFS amplitudes. Using results of Monte-Carlo electron-trajectory simulations, the magnitude of the 'selfabsorption'
distortions is calculated and compared to the results of TEY measurements of Cr, Ni and ZnO samples as a
function of incidence angle.
© EDP Sciences 1997