| Issue |
J. Phys. IV France
Volume 7, Number C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|
|---|---|---|
| Page(s) | C2-343 - C2-344 | |
| DOI | https://doi.org/10.1051/jp4/1997013 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-343-C2-344
DOI: 10.1051/jp4/1997013
1 ESRF, BP. 220, 38043 Grenoble cedex, France
2 ESRF, BP. 220, 38043 Grenoble cedex France
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-343-C2-344
DOI: 10.1051/jp4/1997013
ESRF ID32, SEXAFS and Standing Waves Beamline: An Open Architecture Setup for Surface Studies
F. Comin1, R. de Martino1, K. Fezzaa1, V. Formoso1, L. Orteg2 and R. Signorato11 ESRF, BP. 220, 38043 Grenoble cedex, France
2 ESRF, BP. 220, 38043 Grenoble cedex France
Abstract
The optics of TD32, the SEXAFS and X-Ray Standing Waves (XSW) beamline of ESRF, consists in a main
monochromator, a bimorph mirror, a high resolution postmonochromator and a polarization rotator.
The experimental setup envisages two instruments: a general purpose UHV chamber fitted with the usual surface
preparation and characterization tools and a four circle diffractometer that can host different sample environments
(UHV chambers, liquid cells or controlled atmosphere reactors). Various detection schemes including fluorescence
detectors, crystal analyzers and a two dimensional gas filled detector complete the beamline instrumentation.
© EDP Sciences 1997