| Issue |
J. Phys. IV France
Volume 07, Number C1, Mars 1997
7th INTERNATIONAL CONFERENCE ON FERRITES
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|---|---|---|
| Page(s) | C1-501 - C1-502 | |
| DOI | https://doi.org/10.1051/jp4:19971205 | |
7th INTERNATIONAL CONFERENCE ON FERRITES
J. Phys. IV France 07 (1997) C1-501-C1-502
DOI: 10.1051/jp4:19971205
1 Department of Applied Physics, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259-12 Japan
2 Department of Material Science and Technology, Tokai University, 317 Nishino, Numazu, Shizuoka, 410-03 Japan
3 Department of Metallurgical Engineering, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259-12 Japan
© EDP Sciences 1997
J. Phys. IV France 07 (1997) C1-501-C1-502
DOI: 10.1051/jp4:19971205
Jahn-Teller Effect of Cu-Ferrite Films by Solid Reaction
T. Tanaka1, M. Chiba2, H. Okimura3 and Y. Koizumi11 Department of Applied Physics, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259-12 Japan
2 Department of Material Science and Technology, Tokai University, 317 Nishino, Numazu, Shizuoka, 410-03 Japan
3 Department of Metallurgical Engineering, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259-12 Japan
Abstract
Copper iron oxide (CuFe2O4 : Cu-ferrite) thin film was prepared on a glass substrate by vacuum evaporation and solid reaction, and annealed at 400 °C in the air. The obtained film was identified by X-ray diffraction analysis as Cu-ferrite film having a tetragonal lattice. The axial ratio (c/a) of the film was 1.507 and was larger than that of ASTM data because the lattice distortion of the films seems to be large by difference of a preparation method. The temperature dependence of the magnetization and conductivities of the film showed remarkable changes at about 360°C, which were considered to be caused by phase transition due to the Jahn-Teller effect.
© EDP Sciences 1997