Issue
J. Phys. IV France
Volume 06, Number C8, Décembre 1996
ICIFUAS 11
Eleventh International Conference on Internal Friction and Ultrasonic Attenuation in Solids
Page(s) C8-625 - C8-628
DOI https://doi.org/10.1051/jp4:19968134
ICIFUAS 11
Eleventh International Conference on Internal Friction and Ultrasonic Attenuation in Solids

J. Phys. IV France 06 (1996) C8-625-C8-628

DOI: 10.1051/jp4:19968134

Ultrasonic Attenuation Measurements in Neutron-Irradiated Silicon

M. Coeck1, 2 and C. Laermans1

1  Katholieke Universiteit Leuven, Department of Physics, Celestijnenlaan 200D, 3001 Heverlee, Belgium
2  SCK-CEN, Department BR2, Boeretang 200, 2400 Mol, Belgium


Abstract
At low temperatures, amorphous and partly disordered solids exhibit properties which are different from those in crystals. These anomalies can phenomenologically be described by low-energy excitations which are characterized by a broad distribution of energy and relaxation times : the so-called tunneling states (TS). It was first believed that these TS can only occur in typical glass-forming amorphous solids with a low average coordination of the individual atoms, and also in partly disordered, low-coordinated solids such as neutron-irradiated SiO2, TS have been observed. In order to explore the possibility of the presence of TS in topological more constrained disordered solids, ultrasonic attenuation measurements were started on the fourfold coordinated silicon which was irradiated with fast neutrons to create large regions of lattice disorder. In this paper we will present and discuss the first results of these measurements and we will compare them with results of similar measurements on unirradiated, single-crystalline silicon.



© EDP Sciences 1996