Issue |
J. Phys. IV France
Volume 05, Number C7, Novembre 1995
Second International Conference on Ultra High Purity Base MetalsUHPM - 95 |
|
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Page(s) | C7-167 - C7-173 | |
DOI | https://doi.org/10.1051/jp4:1995717 |
Second International Conference on Ultra High Purity Base Metals
UHPM - 95
J. Phys. IV France 05 (1995) C7-167-C7-173
DOI: 10.1051/jp4:1995717
1 Centre National de la Recherche Scientifique, Centre d'Etudes de Chimie Métallurgique, 15 rue Georges Urbain, 94407 Vitry, France
2 Ecole des Mines, 42023 Saint-Etienne, France
© EDP Sciences 1995
UHPM - 95
J. Phys. IV France 05 (1995) C7-167-C7-173
DOI: 10.1051/jp4:1995717
Activation Analysis Applied to High Purity Metals and Alloys
M. Fedoroff1, J.C. Rouchaud1 and P. Benaben21 Centre National de la Recherche Scientifique, Centre d'Etudes de Chimie Métallurgique, 15 rue Georges Urbain, 94407 Vitry, France
2 Ecole des Mines, 42023 Saint-Etienne, France
Abstract
The application of activation analysis to high-purity metals is reviewed. The advantages, disadvantages and causes of error are discussed. Examples of applications are given and discussed, using neutron, photon and charged particle activation. The main advantage of activation analysis is to avoid and to remove contaminations. This leads to high accuracy even for very low concentrations. Finally, the main characteristics of new mass spectrometric methods versus activation analysis are discussed.
© EDP Sciences 1995