Proceedings of the European Symposium on Frontiers in Science and Technology with Synchrotron Radiation

J. Phys. IV France 04 (1994) C9-145-C9-150
DOI: 10.1051/jp4:1994922

An investigation of the fine structure of the Al-K and Ti-K edges in intermetallic compounds using electron microscopy and synchrotron radiation

G. Blanche¹, M. Jaouen², A.-M. Flank³ and G. Hug<sup>1

1</sup>  Laboratoire d'Etude des Microstructures, ONERA-CNRS, BP. 72, 92322 Châtillon, France
²  Laboratoire de Métallurgie de Physique, UA 131 du CNRS, 40 av. du Recteur Pineau, 86022 Poitiers, France
³  Laboratoire pour l'Utilisation du Rayonnement Electromagnétique, CNRS-CEA-MEN, Centre Universitaire Paris Sud, Campus d'Orsay, Bât 209D, 91405 Orsay cedex, France

Abstract
The extended fine structures of the aluminium and titanium K-edges of metals and intermetallics of the Ti-Al phase diagram are studied using both X-ray Absorption Spectrometry (XAS) and Electron Energy Loss Spectrometry (EELS). The Extended X-ray Absorption Fine Structure (EXAFS) and Extended Electron Energy Loss Fine Structure (EXEELFS) in TiAl due to the first coordination shell are isolated and quantified using the standard method. For more accuracy, the phase and amplitude of backscattering are derived from the experimental measurements in pure metals (Al, Ti) and line compounds (Al₃Ti, Ti₃Al). Results from EXAFS and EXEELFS are in very good agreement. The analyzed volumes can be up to 10⁷ time smaller with electrons, allowing the study of precipitates.

© EDP Sciences 1994