| Issue |
J. Phys. IV France
Volume 04, Number C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
|
|---|---|---|
| Page(s) | C7-95 - C7-98 | |
| DOI | https://doi.org/10.1051/jp4:1994724 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-95-C7-98
DOI: 10.1051/jp4:1994724
Photothermal and Optoelectronic Diagnostics Laboratory, Department of Mechanical Engineering and Manufacturing Research Corporation of Ontario, University of Toronto, Toronto, Ont. Canada, M5S 1A4
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-95-C7-98
DOI: 10.1051/jp4:1994724
Photothermal frequency-domain depth profilometry of a discrete inhomogeneous surface layer on homogeneous substrate
F. Funak, A. Mandelis and M. MunidasaPhotothermal and Optoelectronic Diagnostics Laboratory, Department of Mechanical Engineering and Manufacturing Research Corporation of Ontario, University of Toronto, Toronto, Ont. Canada, M5S 1A4
Abstract
A technique for obtaining thermal diffusivity depth profiles of inhomogeneities in two-layered
systems is discussed. The method uses incremental differences in the photothermal
signal frequency response of a sample with the inhomogeneous surface layer compared to
a homogeneous reference sample. Applications to machined steel samples are reported.
© EDP Sciences 1994