| Issue |
J. Phys. IV France
Volume 04, Number C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
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|---|---|---|
| Page(s) | C7-619 - C7-622 | |
| DOI | https://doi.org/10.1051/jp4:19947146 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-619-C7-622
DOI: 10.1051/jp4:19947146
1 Daimler-Benz AG, Materials Research Lab., Wilhelm-Runge-Strasse 11, 89081 Ulm, Germany
2 Fachbereich Physik, Freie Universität Berlin, Arnimallee 14, 14195 Berlin, Germany
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-619-C7-622
DOI: 10.1051/jp4:19947146
Thermal diffusivities of thin films measured by transient thermal gratings
O.W. Käding1, H. Skurk2 and E. Matthias21 Daimler-Benz AG, Materials Research Lab., Wilhelm-Runge-Strasse 11, 89081 Ulm, Germany
2 Fachbereich Physik, Freie Universität Berlin, Arnimallee 14, 14195 Berlin, Germany
Abstract
Transient thermal gratings have been utilized for investigating heat diffusion in thin films. The gratings were observed by either the displacement technique or by thermoreflectance. Both observation modes allow a quantitative determination of lateral diffusivities. Spatial resolution in the µm range can be obtained, even for films with large thermal diffusivities. Results of thermal diffusivity measurements are presented for thin Au-, Cr-, and Ni-films, sputtered onto the quartz substrates with different thicknesses between l00nm and 3µm.
© EDP Sciences 1994